Romain FOISSAC defenses his thesis on Wednsday 13th of May, 2015

On Wednsday  13th of May 2015 at 2PM at:  amphi des séminaires, bâtiment A, CNRS, Institut Louis Néel.

 

Topics of the thesis: nanoscale study of thin dielectric films reliability with C-AFM technique.

 

 


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